High-speed Analog-to-digital Converters For Modern Satellite Receivers: Design Verification Test And Sensitivity Analysis

Mixed-signal System-on-chip devices such as analog-to-digital converters (ADCs) have become increasingly prevalent in the semiconductor industry. Since the complexity and applications are different for each device, complex testing and characterization methods are required. Specifically, signal integrity in I/O interfaces requires that standard RF design and test techniques must be integrated into mixed signal processes. While such techniques may be difficult to implement, on-chip test-vehicles and…

Author: Kim, Seokjin

Source: University of Maryland

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